Volume 9 • Issue 2 • PP: 25 –32 • 2025
A Novel approach for Minimizing the Process Voltage Temperature Variation (PVT) Detector for Digital Converter Design
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© 2025 The Author(s). Published by ASPG. This article is licensed under the Creative Commons Attribution 4.0 International License (CC BY 4.0).
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Time-to-digital converters (TDCs) are vital components in digital circuitry, crucial for synchronization and precise measurement, demanding high resolution and accuracy. This brief introduces a novel TDC designed in order to reduce the impact of fluctuations in process, voltage, and temperature. A process voltage temperature detector using an extra delay line that is optimized for locking situations is incorporated into the suggested TDC to distinguish PVT corners effectively. Implemented in a 90-nm process, on-silicon measurements reveal impressive performance achieving 30-ps resolution.
Keywords
References
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