International Journal of Wireless and Ad Hoc Communication IJWAC 2692-4056 10.54216/IJWAC https://www.americaspg.com/journals/show/4210 2019 2019 Assistant Professor Department of ECE, Knowledge Institute of Technology, Salem, Tamil Nadu, India R. R. PG Scholar, Department of ECE, Knowledge Institute of Technology, Salem, Tamil Nadu, India R. Mohanraj Assistant Professor Department of ECE, Knowledge Institute of Technology, Salem, Tamil Nadu, India S. Sasidevi Time-to-digital converters (TDCs) are vital components in digital circuitry, crucial for synchronization and precise measurement, demanding high resolution and accuracy. This brief introduces a novel TDC designed in order to reduce the impact of fluctuations in process, voltage, and temperature. A process voltage temperature detector using an extra delay line that is optimized for locking situations is incorporated into the suggested TDC to distinguish PVT corners effectively. Implemented in a 90-nm process, on-silicon measurements reveal impressive performance achieving 30-ps resolution. 2025 2025 41 55 10.54216/IJWAC.090205 https://www.americaspg.com/articleinfo/20/show/4210